Volume 5, Issue 1 (4-1997)
www.ijcm.ir 1997, 5(1): 25-32 |
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Structural study of Heterostructure PZT/YBCO
by (XRD) and (AES). www.ijcm.ir 1997; 5 (1) :25-32
URL: http://ijcm.ir/article-1-894-en.html
URL: http://ijcm.ir/article-1-894-en.html
Abstract: (3119 Views)
Thin films of superconductor YBaCuO(YBCO)
and Pb(ZrTi)O(PZT) is grown by laser ablation technique
to make an electronic device. The quality and the structure
of the films is studied by X-ray diffraction (XRD) and
Auger Electron Spectroscopy (AES). A quantitative analysis
of the films is also deduced from AES study. Analysis of the
films show that the YBCO is grown in (001) and PZT in
(100) direction. From this study we also conclude that laser
ablation technique is a proper method for thin film
production.
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