qua ntit at ive anal ys is o f e leme nt s by X- ray
.s pectroscopy has many appli ca tio ns. In o rd e r to meas ure a
relative amount of an element in a material it is necessary to use
standard samples. However, using too many s tand ard samples
with different pe rcent of elements needs a lo ng processing time
and calculations. X-rays with definite enerJlics are incidenl to the
sample, penet rate to a ce rtain depth, and exc it e alomes to emit
X-ray fl uorescence. The emitted X-ray passes through the sample
and reaches the detector. In this work we have ca lculated exactly
the fluorescent intensity th roughout its passage in the sample.