Formation o f any kinll:-; ur crys ta l defects is
followed hy creatIOn of mechanil.:ul s t resscs wi thim the
t:ry:-;tal strut:tun.!. which in turn l.:'IUses l<.lllicc paramc ters to
change. these changes resu lt a rclevant disp lacement of the
X-ray dilfractogram pcaks. In this wo rk r e la tive
tli :-;piaccmcllt ur it certa in peak ( III) of de fect ed and
annealed :-;amp!c:.:s of AI and Cu [hive bCl:n studied u:-; ing an
X-f<.ly diffrat:Lomctl:r, co ntro lled and assis ted by a high
t:apahle computer progr<.lm. These fac ilit ies p rovide a high
rc:-;olution for determinatio n o f peak's positio n on the
dirrral.:logram so that the relative displacement of a certain
pcak, relevanlto the defected and an nealed samples was
obtained with precision better than -{).Ol A. This study
shows the reliability of our XRD high resol ution method for
va ri o us <.I pp li Cl.ll io ns in the material resea rch fi e ld s. As an
example of its appl it:at ions, using the resu lts o f t his wo rk,
thl,; amount of residual stresses in these samples have been
ue tcrmiocd.