Volume 15, Issue 1 (4-2007)
www.ijcm.ir 2007, 15(1): 211-218 |
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Effects of Annealing on the Crystal Structure of Polycrystalline CdS Thin Films . www.ijcm.ir 2007; 15 (1) :211-218
URL: http://ijcm.ir/article-1-670-en.html
URL: http://ijcm.ir/article-1-670-en.html
Abstract: (2498 Views)
CdS thin films were deposited by thermal evaporation in a vacuum of ~ 10-5 torr at room temperature. Samples were subjected to annealing in the range of temperatures 100-300 oC for 1 hour in air.The crystal structure of CdS films was characterized by XRD technique. Only hexagonal phase with the preferred (002) plane was found in CdS films
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